Control chart pattern recognition using spectral clustering technique and support vector machine under gamma distribution.
Pei-Hsi LeeChau-Chen TorngChi-Hsuan LinChao-Yu ChouPublished in: Comput. Ind. Eng. (2022)
Keyphrases
- spectral clustering
- support vector machine
- control charts
- clustering method
- pairwise
- clustering algorithm
- data clustering
- k means
- constrained spectral clustering
- affinity matrix
- statistical process control
- similarity matrix
- graph laplacian
- abnormal patterns
- image segmentation
- process control
- pattern matching
- normalized cut
- evolutionary clustering
- feature selection
- svm classifier
- co occurrence
- graph partitioning
- eigendecomposition
- spectral methods
- training data
- neural network
- feature vectors
- artificial neural networks
- association rules
- feature space
- object recognition
- machine learning