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Techniques for SAT-based constrained test pattern generation.
Jiri Balcarek
Petr Fiser
Jan Schmidt
Published in:
Microprocess. Microsystems (2013)
Keyphrases
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answer set programming
bounded model checking
neural network
sat solvers
database
ai planning
real time
artificial intelligence
orders of magnitude
answer sets
version space
constraint logic programming
boolean satisfiability