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Random Pattern Testability of Control and Address Circuitry of an Embedded Memory with Feed-Forward Data-Path Connections.

Jacob Savir
Published in: J. Electron. Test. (1999)
Keyphrases
  • feed forward
  • data sets
  • database
  • data collection
  • data structure
  • input data
  • computing power
  • data analysis
  • data points
  • data processing
  • data transfer
  • random access
  • real time
  • neural network
  • artificial intelligence