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Analysis and characterization of process/layout impacts on the performance of high-speed analog circuits.

Long ZhaoFeng ZouJosh YangTianshen TangYuhua Cheng
Published in: ASICON (2017)
Keyphrases
  • high speed
  • analog circuits
  • process model
  • quantitative analysis
  • data sets
  • pattern recognition
  • data analysis
  • statistical analysis
  • development process
  • low power