1/f noise as a reliability indicator for subsurface Zener diodes.

Yiqi Zhuang Lei Du

Published in: Microelectron. Reliab. (2002)

Keyphrases

signal to noise ratio
noise level
noise model
reliability analysis
neural network
data mining
artificial intelligence
additive noise
hyperspectral
noisy data
missing data
noise sensitivity
noise free
noise reduction
real time
denoising
evolutionary algorithm
image sequences
learning algorithm
databases
data sets