Test Pattern Generation for Circuits with Three-state Modules by Improved Z-algorithm.
Noriyoshi ItazakiKozo KinoshitaPublished in: ITC (1986)
Keyphrases
- improved algorithm
- learning algorithm
- preprocessing
- dynamic programming
- computational complexity
- detection algorithm
- optimization algorithm
- computational cost
- high accuracy
- theoretical analysis
- linear programming
- state variables
- recognition algorithm
- ant colony optimization
- experimental study
- segmentation algorithm
- np hard
- cost function
- k means
- optimal solution
- input data
- particle swarm optimization
- expectation maximization
- computationally efficient
- data sets
- worst case
- clustering method
- objective function
- selection algorithm
- image processing
- genetic algorithm