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An Alternative Organization of Defect Map for Defect-Resilient Embedded On-Chip Memories.
Kang Yi
Shih-Yang Cheng
Young-Hwan Park
Fadi J. Kurdahi
Ahmed M. Eltawil
Published in:
Asia-Pacific Computer Systems Architecture Conference (2007)
Keyphrases
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defect detection
embedded systems
information systems
maximum a posteriori
data sets
case study
low cost
high speed
image processing
image sequences
information technology
knowledge management