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Offset-trimming bit-line sensing scheme for gigabit-scale DRAM's.

Jung-Won SubKwang-Myoung RhoChan-Kwang ParkYo-Hwan Koh
Published in: IEEE J. Solid State Circuits (1996)
Keyphrases
  • protection scheme
  • sensor networks
  • data structure
  • line segments
  • high density
  • multiscale
  • management system
  • multi dimensional
  • scale space
  • smart card
  • sensor fusion
  • pseudorandom
  • authentication scheme
  • bit string