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Fast Design Space Exploration Using Local Regression Modeling With Application to ASIPs.

Peter HallschmidResve A. Saleh
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2008)
Keyphrases
  • design space exploration
  • design space
  • image segmentation
  • image analysis
  • software engineering
  • regression model
  • linear regression