A capacitive coupling interface with high sensitivity for wireless wafer testing.
Gil-Su KimMakoto TakamiyaTakayasu SakuraiPublished in: 3DIC (2009)
Keyphrases
- high sensitivity
- optical fiber
- wireless networks
- visual interface
- friendly interface
- user interface
- user friendly
- communication technologies
- massively parallel
- test cases
- integrated circuit
- mobile users
- wireless communication
- software testing
- semiconductor manufacturing
- mobile devices
- real time
- wireless local area network
- data sets
- access network
- wireless lan
- internet access
- multi hop
- database
- mobile networks
- query interface