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Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition.

Walter E. Calienes BartraY. Q. de AguiarCristina MeinhardtAndrei VladimirescuRicardo Augusto da Luz Reis
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • website
  • sufficient conditions
  • evaluation process
  • database
  • information systems
  • databases
  • neural network
  • image segmentation
  • three dimensional
  • similarity measure
  • data structure
  • mobile devices
  • high impact