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Testing 3D stacked ICs for post-bond partial/complete stack.

Surajit Kumar RoyDona RoyChandan GiriHafizur Rahman
Published in: MWSCAS (2012)
Keyphrases
  • software testing
  • genetic algorithm
  • artificial intelligence
  • face recognition
  • neural network
  • information retrieval
  • three dimensional
  • optimal solution
  • object oriented