Adaptive Methods for Machine Learning-Based Testing of Integrated Circuits and Boards.
Mengyun LiuKrishnendu ChakrabartyPublished in: ITC (2021)
Keyphrases
- integrated circuit
- machine learning
- machine learning methods
- significant improvement
- artificial intelligence
- machine learning approaches
- pattern recognition
- empirical studies
- machine learning algorithms
- decision trees
- computing systems
- statistical tests
- statistical methods
- data analysis
- learning systems
- benchmark datasets
- image analysis
- model selection
- knowledge acquisition
- low cost
- information extraction
- knowledge representation
- preprocessing
- active learning