A Semi-Supervised Learning Approach for Identification of Piecewise Affine Systems.
Yingwei DuFangzhou LiuJianbin QiuMartin BussPublished in: IEEE Trans. Circuits Syst. (2020)
Keyphrases
- piecewise affine
- complex systems
- management system
- neural network
- learning systems
- distributed systems
- wide range
- probabilistic model
- special case
- information extraction
- software engineering
- information retrieval systems
- intelligent systems
- building blocks
- decision making
- machine learning
- retrieval systems
- automatic identification
- database