Electron delay analysis and image charge effect in AlGaN/GaN HEMT on silicon substrate.
Alain AgbotonNicolas DefrancePhillipe AltuntasVannessa AvramovicAdrien CutivetRezky OuhachiJean-Claude de JaegerSamira Bouzid-DriadHassan MaherMichel RenvoisePeter FrijlinkPublished in: ESSDERC (2013)
Keyphrases
- image analysis
- image data
- image features
- single image
- image classification
- image retrieval
- multiscale
- low level
- image segmentation
- image collections
- image content
- input image
- similarity measure
- image pixels
- template matching
- image representation
- test images
- image processing algorithms
- high speed
- segmentation method
- visual features
- medical images
- neural network
- edge detection
- wavelet transform
- computer vision