Defect Classification from Electronic Card Images by Deep Learning.
Mustafa EryilmazMetehan ÇilSedat AktürkMehmet TilegiHakan TirakAtila YilmazSeniha Esen YükselDinçer GökcenPublished in: SIU (2022)
Keyphrases
- deep learning
- image database
- input image
- object recognition
- image features
- defect classification
- image classification
- test images
- lighting conditions
- image retrieval
- pattern recognition
- segmentation method
- multiple images
- viewpoint
- text classification
- maximum likelihood
- image regions
- region of interest
- image annotation