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Critical path selection for delay fault testing based upon a statistical timing model.
Li-C. Wang
Jing-Jia Liou
Kwang-Ting Cheng
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2004)
Keyphrases
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critical path
probabilistic model
computational model
statistical model
similarity measure
mathematical model
information retrieval
objective function
evolutionary algorithm
cost function
statistical models
statistical information