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MATIC: Learning around errors for efficient low-voltage neural network accelerators.

Sung KimPatrick HoweThierry MoreauArmin AlaghiLuis CezeVisvesh Sathe
Published in: DATE (2018)
Keyphrases
  • neural network
  • learning systems
  • learning process
  • low voltage
  • pattern recognition
  • low cost
  • image enhancement