Prediction of DC-AC Converter Efficiency Degradation due to Device Aging Using a Compact MOSFET-Aging Model.
Kenshiro SatoDondee NavarroShinya SekizakiYoshifumi ZokaNaoto YorinoHans Jürgen MattauschMitiko Miura-MattauschPublished in: IEICE Trans. Electron. (2020)