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Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers.

Zoltán MicskeiIstván Majzik
Published in: DepCoS-RELCOMEX (2006)
Keyphrases
  • event driven
  • embedded systems
  • high level
  • real time
  • image processing
  • cooperative
  • low cost
  • pattern matching
  • test generation
  • embedded real time systems