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New Front-End and Line Justification Algorithm for Automatic Test Generation.
Ruey-Sing Wei
Alberto L. Sangiovanni-Vincentelli
Published in:
ITC (1986)
Keyphrases
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learning algorithm
k means
dynamic programming
computational complexity
search space
expectation maximization
detection algorithm
optimal solution
np hard
test generation
objective function
open source
segmentation algorithm
pattern matching