Zero-Bias Deep-Learning-Enabled Quickest Abnormal Event Detection in IoT.
Yongxin LiuJian WangJianqiang LiShuteng NiuLei WuHoubing SongPublished in: IEEE Internet Things J. (2022)
Keyphrases
- deep learning
- abnormal event detection
- abnormal events
- unsupervised learning
- management system
- unsupervised feature learning
- machine learning
- daily life
- mental models
- restricted boltzmann machine
- weakly supervised
- decision support system
- active learning
- high dimensional
- reinforcement learning
- deep architectures
- feature extraction
- feature selection