EM-net: Deep learning for electron microscopy image segmentation.
Afshin KhadangiThomas BoudierVijay RajagopalPublished in: ICPR (2020)
Keyphrases
- deep learning
- electron microscopy
- image segmentation
- unsupervised learning
- expectation maximization
- low energy
- x ray
- image stacks
- em algorithm
- machine learning
- unsupervised feature learning
- multiscale
- mental models
- thin film
- region growing
- level set
- computer vision
- weakly supervised
- active contours
- probabilistic model
- maximum likelihood
- graph cuts
- segmentation method
- deformable models
- image processing
- segmentation algorithm
- supervised learning
- shape prior
- input image
- ground truth
- neural network
- object segmentation
- generative model
- object recognition
- markov random field
- d objects