Degradation of GaN-on-GaN vertical diodes submitted to high current stress.

Eric E. Fabris Matteo Meneghini Carlo De Santi Zongyang Hu Wenshen Li Kazuki Nomoto Debdeep Jena Huili Grace Xing Xiang Gao Gaudenzio Meneghesso Enrico Zanoni

Published in: Microelectron. Reliab. (2018)

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