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Versatile TLC NAND flash memory control to reduce read disturb errors by 85% and extend read cycles by 6.7-times of Read-Hot and Cold data for cloud data centers.

Atsuro KobayashiTsukasa TokutomiKen Takeuchi
Published in: VLSI Circuits (2016)
Keyphrases
  • flash memory
  • data center
  • read write
  • hard disk
  • database
  • data sets
  • data analysis
  • data sources
  • storage devices
  • data distribution
  • databases
  • storage systems
  • solid state
  • real time
  • data structure
  • data access
  • disk drives