Reduction of electromigration in aluminium films by copper doping.

Irving Ames Francois Max d'Heurle Richard E. Horstmann

Published in: IBM J. Res. Dev. (2000)

Keyphrases

thin film
neural network
control system
computer simulation
grain size
solar cell
social networks
computational complexity
probabilistic model
attribute reduction
reduction method
electric field
magnetic recording