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Joint Effects of Aging and Process Variations on Soft Error Rate of Nano-Scale Digital Circuits.

Mohammad Sajjad AghadadiMahdi FazeliHakem Beitollahi
Published in: J. Circuits Syst. Comput. (2021)
Keyphrases
  • error rate
  • digital circuits
  • nano scale
  • test set
  • misclassification rate
  • learning algorithm
  • optimal solution
  • data flow