Compact DC model of a JVeSFET transistor with reduced number of empirical parameters.
Michal StaniewskiAndrzej PfitznerPublished in: MIXDES (2015)
Keyphrases
- sensitivity analysis
- parameter estimation
- parameter values
- probabilistic model
- computational model
- machine learning
- gaussian mixture
- formal model
- simulation model
- parameter space
- conceptual model
- experimental data
- theoretical analysis
- management system
- probability distribution
- high level
- mathematical model
- small number
- prior knowledge
- genetic algorithm
- neural network
- analytical models