Login / Signup

Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation.

Rosana RodríguezAlbert Crespo-YepesJavier Martín-MartínezMontserrat NafríaXavier AragonèsDiego MateoEnrique Barajas
Published in: IRPS (2020)
Keyphrases
  • high speed
  • real time
  • monitoring system
  • low cost
  • power consumption
  • data acquisition
  • analog vlsi
  • ultra low power
  • circuit design
  • high power
  • low power