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Extracting transistor changes from device simulations by gradient fitting.
William M. Coughran Jr.
Wolfgang Fichtner
Eric Grosse
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1989)
Keyphrases
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high speed
equivalent circuit
integrated circuit
least squares
gradient direction
real time
low power
data sets
computer vision
image processing
multi agent
edge detection
data acquisition
data extraction
fitting method
steepest ascent