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A Novel Diagnostic Method for Multiple Open-Circuit Faults of Voltage-Source Inverters Based on Output Line Voltage Residuals Analysis.
Tao Chen
Yuedou Pan
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2021)
Keyphrases
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high accuracy
significant improvement
duty cycle
preprocessing
similarity measure
parameter estimation
objective function
data analysis
feature space
expert systems
pairwise
computational cost
probabilistic model
computational complexity
medical images
detection method
transmission line