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Expected Value and Variance of the Indirect Time-of-Flight Measurement With Dead Time Afflicted Single-Photon Avalanche Diodes.

Maik BeerOlaf M. SchreyBedrich J. HostickaRainer Kokozinski
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2018)
Keyphrases
  • time of flight
  • depth map
  • depth information
  • depth images
  • data sets
  • three dimensional
  • multi view
  • infrared
  • monte carlo
  • stereo vision
  • video camera
  • depth data
  • tof camera