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A Novel Negative-Correlation Redundancy Evolutionary Framework Based on Stochastic Ranking for Fault-Tolerant Design of Analog Circuit.

Chao LinJingsong He
Published in: ICSI (1) (2013)
Keyphrases
  • fault tolerant
  • fault tolerance
  • distributed systems
  • analog circuits
  • genetic algorithm
  • high availability
  • negative correlation
  • neural network
  • design methodology
  • fault isolation
  • fault diagnosis
  • load balancing