Low-distortion signal generation for ADC testing.

Fumitaka Abe Yutaro Kobayashi Kenji Sawada Keisuke Kato Osamu Kobayashi Haruo Kobayashi

Published in: ITC (2014)

Keyphrases

signal processing
noise ratio
low signal to noise ratio
high frequency
signal detection
wavelet transform
test cases
high levels
image compression
frequency domain
generation process
original signal