A Reliable and Economical Test Method for Semiconductor Device Aging.
Xinhuan YangQianqian SangChuanzheng WangShuo WangLiang WangYuanfu ZhaoPublished in: APCCAS (2022)
Keyphrases
- preprocessing
- cost function
- clustering method
- high accuracy
- segmentation method
- prior knowledge
- significant improvement
- experimental evaluation
- theoretical analysis
- similarity measure
- highly accurate
- fully automatic
- detection method
- classification accuracy
- error rate
- test data
- matching algorithm
- feature set
- statistical significance
- computationally efficient
- model selection
- medical images
- data sets
- computational cost
- dynamic programming
- multiresolution
- objective function
- feature extraction