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New Microcode's Generation Technique for Programmable Memory Built-In Self Test.
NurQamarina MohdNoor
Azilah Saparon
Yusrina Yusof
Mahmud Adnan
Published in:
Asian Test Symposium (2010)
Keyphrases
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digital signal processors
low cost
computing power
built in self test
memory requirements
general purpose
memory usage
real time
main memory
generation process
low memory
signal processing
multiscale
real world
memory space
working memory
generation algorithm
limited memory
memory access
databases