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RTS Noise and Dark Current White Defects Reduction Using Selective Averaging Based on a Multi-Aperture System.

Bo ZhangKeiichiro KagawaTaishi TakasawaMin-Woong SeoKeita YasutomiShoji Kawahito
Published in: Sensors (2014)
Keyphrases
  • defect detection
  • noisy data
  • real time
  • information systems
  • image segmentation
  • high resolution
  • noise reduction
  • noise level
  • imaging systems
  • noise model