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Wear Relief for High-Density Phase Change Memory Through Cell Morphing Considering Process Variation.

Mengying ZhaoLei JiangLiang ShiYoutao ZhangChun Jason Xue
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2015)
Keyphrases
  • high density
  • high throughput
  • data center
  • training phase
  • low density
  • neural network
  • operating system
  • iterative process
  • magnetic recording