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A Timing Yield Model for SRAM Cells at Sub/Near-Threshold Voltages Based on a Compact Drain Current Model.
Shan Shen
Peng Cao
Ming Ling
Longxing Shi
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)
Keyphrases
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management system
mathematical model
sensitivity analysis
data structure
prior knowledge
cost function
probability distribution
least squares
theoretical analysis
network model
formal model
conceptual model
experimental data
statistical model
process model
computational model
real time
similarity measure
data sets