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TOP-SIFT: A New Method for SIFT Descriptor Selection.

Yujie LiuXiaoming ChenQilu ZhaoZongmin LiJianping Fan
Published in: BigMM (2015)
Keyphrases
  • sift descriptors
  • probabilistic model
  • computer vision
  • matching algorithm
  • image matching
  • classification accuracy
  • pairwise
  • computational cost