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A dual-loop delay-locked loop using multiple voltage-controlled delay lines.

Yeon-Jae JungSeung-Wook LeeDaeyun ShimWonchan KimChanghyun KimSoo-In Cho
Published in: IEEE J. Solid State Circuits (2001)
Keyphrases
  • data sets
  • critical path
  • real time
  • neural network
  • case study
  • three dimensional
  • optimal solution
  • line segments