Minimizing temperature drift errors of conditioning circuits using artificial neural networks.
José Miguel Dias PereiraOctavian PostolachePedro Silva GirãoMihai CretuPublished in: IEEE Trans. Instrum. Meas. (2000)
Keyphrases
- using artificial neural networks
- error accumulation
- artificial neural networks
- finite element analysis
- neural network model
- neural network
- error analysis
- prediction error
- hidden markov models
- image sequences
- concept drift
- data sets
- experimental data
- high speed
- wind speed
- heat transfer
- high temperature
- delay insensitive
- high level synthesis