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Internal testing of integrated circuits by noncontact sampling electrostatic force microscopy using pulse width modulation technique.

Ra'a A. Said
Published in: ISCAS (1) (1999)
Keyphrases
  • integrated circuit
  • pulse width modulation
  • single phase
  • image analysis
  • induction motor
  • electron beam
  • artificial neural networks
  • simulation model
  • fuzzy control
  • printed circuit boards