Defect aware X-filling for low-power scan testing.
S. BalatsoukaVasileios TenentesXrysovalantis KavousianosKrishnendu ChakrabartyPublished in: DATE (2010)
Keyphrases
- low power
- power consumption
- high speed
- low cost
- high power
- single chip
- vlsi architecture
- low power consumption
- wireless transmission
- vlsi circuits
- digital signal processing
- logic circuits
- power saving
- high definition television
- mixed signal
- power reduction
- image processing
- image sensor
- signal processing
- motion estimation