A Tool for Analog/RF BIST Evaluation Using Statistical Models of Circuit Parameters.
Kamel BezniaAhcène BounceurReinhardt EulerSalvador MirPublished in: ACM Trans. Design Autom. Electr. Syst. (2015)
Keyphrases
- statistical models
- parameter estimation
- statistical model
- statistical modeling
- maximum likelihood
- circuit design
- analog vlsi
- expectation maximization
- analog circuits
- statistical methods
- nonlinear models
- least squares
- physical models
- high speed
- model selection
- markov random field
- translation model
- probability models
- probability distribution