Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy.
Omur E. DagdevirenYoichi MiyaharaAaron MascaroTyler EnrightPeter GrütterPublished in: Sensors (2019)
Keyphrases
- frequency response
- instantaneous frequency
- scan data
- image analysis
- high resolution
- structured light
- confocal images
- frequency modulation
- fluorescence microscopy
- spatial frequency
- low frequency
- high throughput
- frequency domain
- image processing
- computer vision
- real world
- electron microscopy
- information systems
- negative consequences
- artificial intelligence
- fundamental limits
- machine learning