Test evaluation and data on defect-oriented BIST architecture for high-speed PLL.
Seongwon KimMani SomaPublished in: ITC (2001)
Keyphrases
- high speed
- data sets
- database
- data quality
- complex data
- data structure
- data analysis
- real time
- historical data
- data distribution
- synthetic data
- small number
- high quality
- data points
- data collection
- high dimensional data
- data acquisition
- training data
- databases
- statistical significance
- knowledge discovery
- data streams
- spatial data
- experimental data
- noisy data
- neural network
- statistical tests