Identification of Correlated Device Model Parameter Values for Worst-Case Circuit Performance Analysis.

Abhijit Dharchoudhury S. M. Kang

Published in: VLSI Design (1992)

Keyphrases

parameter values
parameter estimation
parameter space
lower bound
learning algorithm
parameter settings
experimental data
computational model
worst case
management system
prior knowledge
maximum likelihood
markov chain
mathematical model
pairwise
high level
neural network