Reliability for nanomagnetic logic (NML) readout circuit under single event effect.

Baojun Liu Li Cai Yan Li Qiang Kang

Published in: Microelectron. J. (2015)

Keyphrases

nonmonotonic logics
high speed
delay insensitive
digital circuits
logic circuits
logic synthesis
neural network
artificial intelligence
expert systems
social media
low cost
modal logic
event sequences
circuit design
analog circuits