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Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs.
Amir Zjajo
Qin Tang
Michel Berkelaar
José Pineda de Gyvez
Alessandro Di Bucchianico
Nick van der Meijs
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2011)
Keyphrases
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data analysis
high speed
information systems
multiscale
image analysis
quantitative analysis
data sets
information retrieval
artificial intelligence
e learning
medical images